Ensuring database integrity in .NET

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SQL is extremely flexible and can accept data from seven distinctly different types of data sources within the from clause: SQL Server tables. Subqueries serving as derived tables, also called subselects or in-line views, are explained in 10, Including Subqueries and CTEs. Common table expressions (CTEs) new to SQL Server 2005 add new features and formatting to the traditional subquery. Views, or stored select statements, can be referenced within the from clause as if they were tables. Views are discussed in 14, Selecting Data through Views. Table-valued user-defined functions return rows and columns. See 22, Building User-Defined Functions, for more information. Distributed data sources pull in data from other databases or applications (e.g., Access, Excel, Oracle) using openquery() and other functions, as detailed in 15, Working with Distributed Queries. XML data sources using XQuery, as discussed in 31, Using XML, SOAP, XPath, and Xquery.
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Sharing has its benefits, but it also has pratfalls. If you share media files directly, for instance, rather than through Media Player 11 s sharing dialog box (see 18), and that person tries to play the files, he or she might not have the appropriate digital rights.
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Compared with other materials, semiconductors have unique properties that make them very suitable for the detection of ionizing radiation. Furthermore, semiconductors especially silicon are the most widely used basic materials for electronic amplifying elements (transistors) and more recently for complete microelectronics circuits. Thus, part of the process technology that already existed in (micro) electronics could be taken or adapted for detector production.1 Integration of detector and electronics could be envisaged. In the following, the properties of important semiconductor materials will be discussed. The uniqueness of semiconductor material properties can best be appreciated by comparing them with the most widely used radiation detectors that are based on ionization in gas. Values for silicon will be used in this comparison. The small band gap (1.12 eV at room temperature) leads to a large number of charge carriers per unit energy loss of the ionizing particles to be detected. The average energy for creating an electron hole pair (3.65 eV) is an order of magnitude smaller than the ionization energy of gases (30 eV). Therefore the energy of X-rays can be measured with much higher precision and down to lower energies than is possible with gas detectors. The high density (2.33 g/cm3 ) leads to a short absorption length of low and medium energy X-rays and to a large energy loss per traversed length of the ionizing particle (3.8 MeV/cm for a minimum ionizing particle). Therefore it is possible to build thin detectors that still produce large enough signals to be measured. In addition, the very small range of delta-electrons prevents large shifts of the centre of gravity of the primary ionization from the position of the track. Thus an extremely precise position measurement (of a few micrometres) is possible.
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The perfect reconstruction conditions are obtained by setting (6.114) Using the property [87]
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Several sample tables with both gauge and bend data are provided on the CD-ROM that accompanies this book.
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Determining how often to run Disk Defragmenter depends on how often you use your computer. If a machine is in continuous operation, run it as often as once per week. If you spend an average of an hour or two a day on your machine, be sure to do it at least once per month. And it doesn t interfere with your getting your work done because you can continue to work on your computer while Disk Defragmenter runs in the background. Disk Defragmenter is easy to find and use; this is all you need to do:
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5. Click to make your selection, and then click Next. In the screen that appears, choose the appropriate album entry for your artist, and click Next again. In this example, I scroll through the list of known Beck material. Note that this album came with a bonus DVD, so I choose the The Information (2 Albums) entry (Figure 18.14). Finally, I have found the proper album. 6. In the final screen, tell Windows that the album you chose is correct by clicking Finish (Figure 18.15). The view returns to Windows Media Player 11 (Figure 18.16).
Working with XML Data Sources
23: Email Server
WordPress has its own set of template tags. This appendix has been created as a reference to all of the template tags available to theme developers along with all Arguments that can be used.
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Mold Tools are really meant for tooling engineers, but part designers often use the first part of the process to apply draft to parts. Tooling engineers often need to add or correct draft to plastic parts they receive from part designers without draft or that are not designed with any process in mind whatsoever.
Modeling in Context
mode voltage probes. Shields of differential-mode probes are grounded only at the measuring instrument. Any voltage difference along the cable shield and instrument ground is rejected as a common-mode signal. Current-based differential-mode probes are useful to measure relative phase and amplitude between two common-mode currents providing differential-mode information. If the magnitude of current in two transmission lines is known, it becomes an easier task to find the source of the EMI problem. This can only happen if the probes used have a response that is matched to within a few percent of each other. When two current probes are connected to a signal combiner, the length of the cable interconnects must be identical along with the addition of 50 feed-through termination at the output of each current probe. Identical cables preserve both relative phases between signals. The terminator ensures the combiner sees 50 on both ports. When using a signal combiner, remember to account for a typical 6 dB attenuation loss from the output of each current probe resulting from the 50- terminator that was provided to match the coax impedance to the combiner. Before using any differential-mode probe, it is important to perform a null test [1]. A null test allows one to learn if a problem exists. To perform a null test using a voltage probe, the two tips are connected together. There should be no signal present on the analyzer or scope. If a signal is present, a damaged cable may exist or the combiner has a problem. For current probes, there are two methods of testing. One method takes a single wire and probe. This single piece of wire is run both in and then out of the probe at the same time. If RF currents are on the wire, they will cancel and produce no output voltage from the clamp. The second test is for a single wire and two probes. Both probes are clamped on the wire physically placed adjacent to each other in opposite orientation. The combiner output should be reduced by 20 30 dB when both probes are used versus one probe only. This output level should be consistent across the frequency range of operation. Examples of how to perform null experiments are provided in Figure 5.27. Note that a combiner is required when two probes are used at the same time.
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